The second experiment CUSAC would like to have performed is more complex, but still conceptually simple.
It is a delayed eraser double slit experiment using electrons as the particle.
Detectors D1 and D2 have no memory and produce detector output information that is non-unique.
A detection pulse produced by D1 is identical to a detection pulse produced by D2. W-w (which-way) data is retained by the two separate detector data paths D1 and D2. Just before the two paths converge into one common path (therefore erasing the which-way (w-w) data before it is recorded in R1), a “w-w-device” randomly injects unique w-w path identification data into any detection information traveling down either path, thus allowing w-w information to be recorded in R1. DPD = diffraction (wave) pattern and PPD = particle pattern distribution refers to the particle distribution captured on the result screen by R3.
(The following experiment setup diagrams, are used only to illustrate the concepts, not to define the actual physical setup.)
The purpose of this experiment is to produce data from which an algorithm can be constructed that computes the probability of a particle (impacting the result screen at a point defined by the coordinate x) being part of a wave (diffraction) pattern or a particle pattern. This algorithm is used in experiment 2B.
First, adjust the parameters (e.g., slit size, slit width, distance ds between the slits and the result screen, and electron velocity) of this experiment (using electrons as particles) such that the wave and particle patterns found on the result screen and recorded by R3 are deconflicted as much as possible (overlap as little as possible).
Secondly, (1) run this experiment a sufficient number of times (with the w-w-device turned on — producing recorded w-w data) to produce a very well-defined particle pattern. And (2) run this experiment a sufficient number of times (with the w-w-device turned off — no w-w data) to produce a very well-defined wave (diffraction) pattern.
Thirdly, using the data from (1) and (2) to develop an algorithm that computes the probability of an electron (that impacts a given point on the result screen) being part of a wave pattern or a particle pattern.